As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the ...

What you’ll learn: How oscilloscope-based packages improve bring-up, debugging, and validating power converters as well as help engineers achieve faster and more repeatable measurements. How analysis ...

Why predicting power behavior is getting harder for AI chips. Dynamic Power Analysis: Closing the pre- versus post-silicon gap. The massive complexity and computational needs of today’s most advanced ...